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■ FOUP; OPEN CASSETTE; FOSB
3S KOREA
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■ Single Wafer Test + Burn In,
Multi Wafer Test + Burn In, Die
Level Test + Burn In Solution,
Burn-In-Boards
AEHR TEST
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■ Auto Package Inspection,
Tape and Reel; I-Focus, OTF Auto Wafer
Inspection for Frame and
whole Wafer, 6“, 8“, 12“
ASTI
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■ WX-3000, Auto Optical
Inspection for Probe Cards,
Trays.
CYBEROPTICS
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■ Wireless Wafer Sense for Measurement,
Leveling, Vibration, Particle,
Teaching, Gapping, Humidity.
Reticle Sense, Wafer Mapper
CYBEROPTICS
SEMICONDUCTOR
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■ SMT Lead Forming Equipment for High Performance Packages
FANCORT
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■ Cantilever & Blade Type Probe Cards, Design, Manufacturing, Motherboards. ISO 9001:2015 certified + MINIPROBER: The World's Smallest Prober
HTT DRESDEN
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■ All-in-One High Performance Wafer ID Reader for OCR, Barcode, DataMatrix, QR Code
IOSS
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[Download Datasheet as PDF]
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■ Online Cleaning Solutions for Probe Cards, Wafer Chuck Cleaning, Socket Cleaning
INTERNATIONAL TEST
SOLUTIONS
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■ ACCRETECH Refurbished Wafer Probers, Onsite COLD Upgrades, Technical Support, Prober Spare Parts
IS-TEST
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■ Soldering Robots,
Laser Soldering Systems,
Solder Paste Mixer,
Ultrasonic Soldering
JAPAN UNIX
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■ Opto-Electronical Probecards
JENOPTIK
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■ High Performance Sockets for Final Test on Packages and Wafer Level Device Testing
JOHNSTECH
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■ 4090µ+ Prober, Upgrades for 4080,4090, Electroglas-iP. Frame Prober
MARTEK
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■ Automatic Notch Finder with IOSS Wafer ID Reader, 200mm Batch Wafer ID Reader
MECHATRONIC
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■ Thermal Temperature Cycling Systems, bringing Precise HOT & COLD Temperature to the Test
MPI THERMAL
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■ Advanced Ultra Fine Pitch Cantilever, Vertical & MEMS Probe Cards; Repair & Service Center Dresden
MPI PROBECARD
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■ Particle Calibration Wafer,
Vaporizer, Particle Deposition
Systems, Nano Silica
MSP
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■ Batch Wafer Reader 4”, 6”,
Batch Wafer Transfer, Micro,
Macro and Green Light Wafer
Inspection, Post Dicing and
Wirebond Inspection
QES
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■ High Volume Handler for Power and MEMS Devices, Discrete Tester for Power Devices
TESEC
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■ ESD Structure Testing for Chip Design and Qualification for: HBM, MM, Latch-up, CDM, TLP
THERMO SCIENTIFIC
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■ Test - Environmental Chambers, Curing Ovens, BlueM, Gruenberg, Lunaire, Tenney, Wisconsin
TPS
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■ Handler & Prober-Dockings, I/F,
Stiffener, Probe Card Storage,
ProbeCard Trolleys, Convertion
Kit MT9510, TH-Manipulator
TURBODYNAMICS
